Jeon, B.; Jung, H.G.; Lee, S.W.; Lee, G.; Shim, J.H.; Kim, M.O.; Kim, B.J.; Kim, S.-H.; Lee, H.; Lee, S.W.;
et al. Melanoma Detection by AFM Indentation of Histological Specimens. Diagnostics 2022, 12, 1736.
https://doi.org/10.3390/diagnostics12071736
AMA Style
Jeon B, Jung HG, Lee SW, Lee G, Shim JH, Kim MO, Kim BJ, Kim S-H, Lee H, Lee SW,
et al. Melanoma Detection by AFM Indentation of Histological Specimens. Diagnostics. 2022; 12(7):1736.
https://doi.org/10.3390/diagnostics12071736
Chicago/Turabian Style
Jeon, Byoungjun, Hyo Gi Jung, Sang Won Lee, Gyudo Lee, Jung Hee Shim, Mi Ok Kim, Byung Jun Kim, Sang-Hyon Kim, Hyungbeen Lee, Sang Woo Lee,
and et al. 2022. "Melanoma Detection by AFM Indentation of Histological Specimens" Diagnostics 12, no. 7: 1736.
https://doi.org/10.3390/diagnostics12071736
APA Style
Jeon, B., Jung, H. G., Lee, S. W., Lee, G., Shim, J. H., Kim, M. O., Kim, B. J., Kim, S.-H., Lee, H., Lee, S. W., Yoon, D. S., Jo, S. J., Choi, T. H., & Lee, W.
(2022). Melanoma Detection by AFM Indentation of Histological Specimens. Diagnostics, 12(7), 1736.
https://doi.org/10.3390/diagnostics12071736