A Review on In-Situ Monitoring in Wire Arc Additive Manufacturing: Technologies, Applications, Challenges, and Needs
Abstract
1. Introduction
2. Overview of In-Situ Monitoring in WAAM
2.1. Goals of In-Situ Monitoring
| Various in-Situ Monitoring | Equipment | Measurable Parameters | Measurement Approach | Ref. |
|---|---|---|---|---|
| Optical and vision-based monitoring | IR camera | Thermal (infrared) intensity | The infrared camera detects radiative energy from the molten pool and its surrounding area to generate thermal intensity maps, which show temperature variations during the WAAM process. | [69] |
| CMOS sensor | Nozzle-to-work distance | They measure the nozzle to work distance indirectly by measuring the wire that sticks out through semantic segmentation, and add it to a hidden length of wire in the nozzle | [58] | |
| CCD camera | Melt-pool contact angles and arc radius | Processing of the captured images of the melt pool to extract its boundary profile. The melt pool edge is then fitted with tangent lines at specific points using a geometric fitting algorithm | [70] | |
| CMOS sensor | Molten pool region | A CMOS sensor captures the optical emission from the molten pool. It detects molten pool signals by using pixel-intensity tracking. The captured image sequence is analyzed over time to determine how quickly droplets change and how stable the arc remains. | [55] | |
| CMOS sensor | Light intensity distribution from the melt pool | Droplet size and detachment frequency are extracted through image-processing techniques applied to the light-intensity distribution captured in successive frames. | [71] | |
| Acoustic and sound-based monitoring | Acoustic sensor | Acoustic pressure signal emitted by the arc | The sound signal goes through FFT analysis to obtain frequency-domain features that include dominant frequency and spectral power, and bandwidth measurements, which link to metal transfer stability and weld quality. | [72] |
| Shure SM57 dynamic microphone | Acoustic pressure fluctuation emitted by the welding arc | The microphone converts sound pressure waves into electrical signals, which become digital data for stability feature and defect indicator analysis through wavelet coefficients. | [73] | |
| Microphone | Sound waveform | The microphone records the acoustic pressure waveform from the welding arc. The kurtosis value of this sound signal, which stems from the time-domain waveform, helps evaluate arc stability and forecast metal deposition performance. | [74] | |
| Electrical signal monitoring | Current/voltage signal acquisition system | Welding current and arc voltage | The recorded electrical signals received wavelet denoising and time-domain analysis to extract average, RMS, and peak values. Variation in recorded signals affects the molten pool droplet behavior and arc stability. | [75] |
| Lincoln Power Wave software 2025 | Welding current and voltage | Arc stability and droplet transfer behavior can be deduced by analyzing current and voltage in short-circuit and pulsed transfer operations | [55] | |
| Thermal and temperature monitoring | Passive infrared thermography camera | Infrared radiance map | The measurement process is performed with online thermograph acquisition, then image analysis helps to detect thermal irregularities (hotspots and non-uniform cooling patterns), which indicate weld defects. | [76] |
| Thermocouple and IR pyrometer | Inter-layer temperature | Two measurement approaches, the Upper Pyrometer and Sideward Pyrometer measurement techniques, are used through sensor placement at set arc distances, followed by emissivity calibration, to determine their effectiveness for temperature control between layers. | [52] | |
| Force and vibration monitoring | Force Torque sensor | Contact force | A force sensor monitors the contact force between the dry-coupled ultrasonic roller probe and the WAAM surface. The robotic controller performs Z-axis adjustments to the probe in real time for stable contact pressure maintenance, which allows reliable in-process ultrasonic data acquisition during layer-by-layer inspection. | [62] |
| Vibration sensor/acceleration sensor | Acceleration amplitude/frequency | By measuring the acceleration amplitude/frequency, and combining with imaging of the arc, the arc morphology, and droplet transition behavior can be analyzed. | [54] |
2.2. Types of Signals and Parameters Measurable in WAAM
2.3. Monitoring Strategies: Direct vs. Indirect, Intrusive vs. Non-Intrusive
3. Optical and Vision-Based Monitoring
3.1. High-Speed Cameras, CCD/CMOS Systems
3.2. Infrared Cameras
3.3. Molten Pool Geometry, Bead Shape, and Surface Condition Monitoring
4. Acoustic and Sound-Based Monitoring
4.1. Acoustic Emission Sensors
4.2. Arc Sound Monitoring for Defect Detection
5. Electrical Signal Monitoring
5.1. Arc Voltage and Current Sensing
5.2. Wire Feed Rate, Travel Speed, and Power Fluctuations
6. Thermal and Temperature Monitoring
6.1. Infrared Thermography
6.2. Pyrometers
6.3. Cooling Rate and Solidification Control
7. Force and Vibration Monitoring
7.1. Force Sensors on Deposition Head
7.2. Vibration Analysis for Stability Monitoring
8. Multi-Sensor Fusion Approaches
9. Applications of In-Situ Monitoring in WAAM
9.1. Defect Detection and Prevention
9.2. Process Stability Monitoring
9.3. Microstructure and Mechanical Property Correlation
9.4. In-Situ Monitoring to Reduce Residual Stress and Distortion
9.5. Closed-Loop Control and Adaptive Process Parameter Adjustment
10. Current Challenges, Research Gaps, and Needs
10.1. Standardization of Monitoring Methodologies and Protocols
10.2. Development of Robust, Cost-Effective, and Scalable Monitoring Systems
10.3. Advanced Data Analytics and AI/ML Applications
10.4. Multi-Physics Modeling Coupled with Real-Time Monitoring
10.5. Need for Quantum Sensing
10.6. Transition from Lab-Scale Demonstrations to Industrial Implementation
11. Outlook
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
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| Applications of In-Situ Monitoring in WAAM | Sensors Used | Explanation | Advantages and Limitations | Ref. |
|---|---|---|---|---|
| Defect detection and prevention | High speed camera, acoustic sensor, IR camera |
| Advantages: Early defect detection, reduced scrap rates, comprehensive coverage Limitations: Complex data processing, sensor integration challenges, computational demands | [70,73,141] |
| Process stability monitoring | CCD/CMOS sensors, high speed camera, IR camera |
| Advantages: Continuous quality assurance, quantifiable stability metrics Limitations: Sensitivity to ambient conditions, arc brightness interference, calibration requirements | [54,55,75,113,126,141] |
| Microstructure control | IR Thermal imaging and CCD camera |
| Advantages: Enhanced material properties, predictable microstructure, reduced heat-affected zones Limitations: Limited penetration depth measurement, surface-only observation, complex thermal data calibration | [142,143] |
| In-situ monitoring to reduce residual stress and distortion | Laser displacement sensors, digital image correlation (DIC) |
| Advantages: Dimensional accuracy improvement, proactive distortion mitigation Limitations: Requires clear line-of-sight, sensitive to vibrations, data post-processing needed | [144,145] |
| Closed-loop control and adaptive process parameter adjustment | Voltage and current sensors, IR imaging sensor, optical sensors |
| Advantages: Autonomous quality control, process repeatability, reduced operator dependence Limitations: Control algorithm complexity, sensor lag time, system integration costs | [146] |
| Quantum Sensors | Sensitivity and Detection Bandwidth | Spatial Resolution | Working Temperature | Magnetic Shielding |
|---|---|---|---|---|
| SQUID magnetometers | 2–5 fT Hz−1/2 in the 1 Hz to 1 kHz | 15 nm | Below 77 K | >100 nT |
| SERF atomic magnetometers | 7–10 fT Hz−1/2 in the 1–100 Hz | 7–8 nm | 373–423 K | <1.5 nT |
| Single NV-diamond magnetometers | 0.5 µT Hz−1/2 in the kHz | 10 nm | Room temperature | Magnetic shielding is needed to shield the ambient magnetic field noise, when the target magnetic field is much smaller than the ambient magnetic noise. |
| NV ensembles diamond magnetometers | 2–6 pT Hz−1/2 in the 20–200 Hz | 0.34 nm |
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Arjomandi, M.; Motley, J.; Ngo, Q.; Anees, Y.; Afzal, M.A.; Mukherjee, T. A Review on In-Situ Monitoring in Wire Arc Additive Manufacturing: Technologies, Applications, Challenges, and Needs. Machines 2026, 14, 19. https://doi.org/10.3390/machines14010019
Arjomandi M, Motley J, Ngo Q, Anees Y, Afzal MA, Mukherjee T. A Review on In-Situ Monitoring in Wire Arc Additive Manufacturing: Technologies, Applications, Challenges, and Needs. Machines. 2026; 14(1):19. https://doi.org/10.3390/machines14010019
Chicago/Turabian StyleArjomandi, Mohammad, Jackson Motley, Quang Ngo, Yoosuf Anees, Muhammad Ayaan Afzal, and Tuhin Mukherjee. 2026. "A Review on In-Situ Monitoring in Wire Arc Additive Manufacturing: Technologies, Applications, Challenges, and Needs" Machines 14, no. 1: 19. https://doi.org/10.3390/machines14010019
APA StyleArjomandi, M., Motley, J., Ngo, Q., Anees, Y., Afzal, M. A., & Mukherjee, T. (2026). A Review on In-Situ Monitoring in Wire Arc Additive Manufacturing: Technologies, Applications, Challenges, and Needs. Machines, 14(1), 19. https://doi.org/10.3390/machines14010019

