Figure 1.
Panel (a) (1–4, black) shows path planning on a flat surface, while panel (b) (1–6, red) demonstrates how the system adapts to a curved surface.
Figure 1.
Panel (a) (1–4, black) shows path planning on a flat surface, while panel (b) (1–6, red) demonstrates how the system adapts to a curved surface.
Figure 2.
Schematic diagram of the ABBIFC methodology, which incorporates Bézier–hexic polynomial interpolation and impedance force controller with adaptive stiffness and a force corrector.
Figure 2.
Schematic diagram of the ABBIFC methodology, which incorporates Bézier–hexic polynomial interpolation and impedance force controller with adaptive stiffness and a force corrector.
Figure 3.
The proposed method: (a) construction of Bézier−hexic curves under force controller and (b) method for optimization of motion and force accuracy.
Figure 3.
The proposed method: (a) construction of Bézier−hexic curves under force controller and (b) method for optimization of motion and force accuracy.
Figure 4.
Simulation block diagram showing the integration of constant force control with a Bézier trajectory to regulate interaction forces during the process.
Figure 4.
Simulation block diagram showing the integration of constant force control with a Bézier trajectory to regulate interaction forces during the process.
Figure 5.
Panels (a–c) show the data and control points on a curved surface, a complex surface, and a curved–complex surface, respectively.
Figure 5.
Panels (a–c) show the data and control points on a curved surface, a complex surface, and a curved–complex surface, respectively.
Figure 6.
Panels (a,d) show the position and force tracking based−constant impedance controller for the curved surface, panels (b,e) for the complex surface, and panels (c,f) for the curved–complex surface.
Figure 6.
Panels (a,d) show the position and force tracking based−constant impedance controller for the curved surface, panels (b,e) for the complex surface, and panels (c,f) for the curved–complex surface.
Figure 7.
Panels (a–c) show the force and position tracking based−constant impedance controller for the curved, complex, and curved–complex surfaces, respectively.
Figure 7.
Panels (a–c) show the force and position tracking based−constant impedance controller for the curved, complex, and curved–complex surfaces, respectively.
Figure 8.
Panels (a–c) show the robot’s stiffness compensation in response to environment stiffnesses before force correction, for the curved, complex, and curved–complex surfaces, respectively.
Figure 8.
Panels (a–c) show the robot’s stiffness compensation in response to environment stiffnesses before force correction, for the curved, complex, and curved–complex surfaces, respectively.
Figure 9.
Panels (a,d) show the corrected force on the curved surface, panels (b,e) on the complex surface, and panels (c,f) on the curved−complex surface.
Figure 9.
Panels (a,d) show the corrected force on the curved surface, panels (b,e) on the complex surface, and panels (c,f) on the curved−complex surface.
Figure 10.
Panels (a,d) show the position and contact force on the curved surface, panels (b,e) on the complex surface, and panels (c,f) on the curved–complex surface.
Figure 10.
Panels (a,d) show the position and contact force on the curved surface, panels (b,e) on the complex surface, and panels (c,f) on the curved–complex surface.
Figure 11.
Panels (a–c) show the hexic curve speed planning on a curved surface, a complex surface, and a curved–complex surface, respectively.
Figure 11.
Panels (a–c) show the hexic curve speed planning on a curved surface, a complex surface, and a curved–complex surface, respectively.
Figure 12.
Panels (a–c) show ABBIFC force control applied to all position points on the curved, complex, and curved−complex surfaces, respectively.
Figure 12.
Panels (a–c) show ABBIFC force control applied to all position points on the curved, complex, and curved−complex surfaces, respectively.
Figure 13.
Panels (a–c) show the robot’s stiffness compensation in response to environment stiffnesses, after force correction, for the curved, complex, and curved−complex surfaces, respectively.
Figure 13.
Panels (a–c) show the robot’s stiffness compensation in response to environment stiffnesses, after force correction, for the curved, complex, and curved−complex surfaces, respectively.
Figure 14.
Position and force tracking under disturbance conditions: (a) without the force corrector, and (b) with ABBIFC including force correction, using the same impedance parameters as in the ideal condition case.
Figure 14.
Position and force tracking under disturbance conditions: (a) without the force corrector, and (b) with ABBIFC including force correction, using the same impedance parameters as in the ideal condition case.
Figure 15.
Panel (a) shows position tracking performance using ABBIFC compared to the WNN impedance controller, while panel (b) shows the contact force tracking.
Figure 15.
Panel (a) shows position tracking performance using ABBIFC compared to the WNN impedance controller, while panel (b) shows the contact force tracking.
Figure 16.
Panel (a) shows position tracking performance using ABBIFC compared to the adaptive impedance controller, while panel (b) shows the contact force tracking.
Figure 16.
Panel (a) shows position tracking performance using ABBIFC compared to the adaptive impedance controller, while panel (b) shows the contact force tracking.
Figure 17.
Panel (a) shows the experimental setup used in the study, while panel (b) illustrates the paths applied on the curved, complex, and curved–complex surfaces.
Figure 17.
Panel (a) shows the experimental setup used in the study, while panel (b) illustrates the paths applied on the curved, complex, and curved–complex surfaces.
Figure 18.
Panel (a) shows the motion and force control interface using the Qt graphical user interface, while panel (b) illustrates the communication scheme utilizing INtime technology.
Figure 18.
Panel (a) shows the motion and force control interface using the Qt graphical user interface, while panel (b) illustrates the communication scheme utilizing INtime technology.
Figure 19.
The relationship between air pressure and tool speed during the tests, illustrating how changes in air pressure affect the tool’s performance at varying speeds.
Figure 19.
The relationship between air pressure and tool speed during the tests, illustrating how changes in air pressure affect the tool’s performance at varying speeds.
Figure 20.
Panels (a,b) show the real−time polishing paths and contact force on a curved surface. Panels (c,d) illustrate the same parameters on a complex surface, while panels (e,f) show the results on a curved–complex surface for both constant impedance and the ABBIFC method.
Figure 20.
Panels (a,b) show the real−time polishing paths and contact force on a curved surface. Panels (c,d) illustrate the same parameters on a complex surface, while panels (e,f) show the results on a curved–complex surface for both constant impedance and the ABBIFC method.
Figure 21.
Panels (a–c) show speed planning on the curved, complex, and curved–complex surfaces, respectively, using the constant impedance controller and the ABBIFC method.
Figure 21.
Panels (a–c) show speed planning on the curved, complex, and curved–complex surfaces, respectively, using the constant impedance controller and the ABBIFC method.
Figure 22.
Panels (a–c) show the experimental setup, path tracking, and contact force, respectively, using the constant AWSPIF controller and proposed ABBIFC method.
Figure 22.
Panels (a–c) show the experimental setup, path tracking, and contact force, respectively, using the constant AWSPIF controller and proposed ABBIFC method.
Figure 23.
Surface shapes on complex surface: (a) before polishing, (b) after polishing using the standard baseline method, and (c) after polishing using ABBIFC approach.
Figure 23.
Surface shapes on complex surface: (a) before polishing, (b) after polishing using the standard baseline method, and (c) after polishing using ABBIFC approach.
Figure 24.
Surface roughness at selected point 1: (a) before polishing, (b) after polishing using the standard baseline method, and (c) after polishing based on ABBIFC method.
Figure 24.
Surface roughness at selected point 1: (a) before polishing, (b) after polishing using the standard baseline method, and (c) after polishing based on ABBIFC method.
Figure 25.
Surface roughness at selected point 1 of complex surface: (a) before polishing, (b) after polishing using the standard baseline method, and (c) after polishing using ABBIFC method.
Figure 25.
Surface roughness at selected point 1 of complex surface: (a) before polishing, (b) after polishing using the standard baseline method, and (c) after polishing using ABBIFC method.
Figure 26.
OLYMPUS LEXT OLS5000 measurement laser device.
Figure 26.
OLYMPUS LEXT OLS5000 measurement laser device.
Table 1.
The collected data points (mm) and attitudes (rad) on a curved surface.
Table 1.
The collected data points (mm) and attitudes (rad) on a curved surface.
Point | X | Y | Z | | | |
---|
P0 | −761.58 | 273.71 | 201.17 | 1.6850 | −1.6046 | 0.6381 |
P1 | −751.25 | 167.53 | 260.11 | 1.8299 | −1.8496 | 0.2826 |
P2 | −758.49 | 42.49 | 297.31 | 2.0191 | −2.2469 | −0.1053 |
P3 | −770.43 | −56.37 | 279.34 | −2.0172 | 2.2109 | 0.6578 |
P4 | −780.92 | −155.92 | 211.94 | −1.8369 | 1.7216 | 0.9276 |
P5 | −838.91 | −129.88 | 240.70 | −2.2601 | 1.2910 | 0.6319 |
P6 | −837.91 | −32.94 | 287.20 | −2.6821 | 1.2553 | −0.0589 |
P7 | −832.31 | 85.67 | 291.05 | 2.8625 | −0.9327 | 0.4517 |
P8 | −837.56 | 172.88 | 257.67 | 2.7563 | 0.1066 | 0.4618 |
Table 2.
The collected data points (mm) and attitudes (rad) on a complex surface.
Table 2.
The collected data points (mm) and attitudes (rad) on a complex surface.
Point | X | Y | Z | | | |
---|
P0 | −779.59 | 205.85 | 54.50 | 2.1818 | −2.1497 | 0.1855 |
P1 | −863.28 | 166.78 | 53.56 | 2.2539 | −2.1307 | 0.1275 |
P2 | −814.71 | 44.06 | 59.23 | −2.2739 | 1.9728 | −0.2256 |
P3 | −837.61 | −60.52 | 54.20 | −2.3201 | 2.0175 | 0.1772 |
P4 | −770.64 | −101.68 | 54.90 | −2.5710 | 1.7389 | 0.0461 |
P5 | −714.46 | −44.93 | 54.10 | 2.5555 | −1.7024 | −0.11 |
P6 | −737.69 | 41.32 | 55.48 | 2.6502 | −1.4288 | 0.3228 |
P7 | −705.74 | 177.05 | 53.54 | 2.8063 | −1.3045 | −0.0495 |
Table 3.
The collected data points (mm) and attitudes (rad) on a curved–complex surface.
Table 3.
The collected data points (mm) and attitudes (rad) on a curved–complex surface.
Point | X | Y | Z | | | |
---|
P0 | −707.29 | 280.85 | 280.19 | 1.9984 | −1.8559 | 0.4899 |
P1 | −714.59 | 216.50 | 203.56 | 2.0548 | −2.1785 | 0.2222 |
P2 | −714.84 | 138.54 | 328.76 | 1.9902 | −2.1094 | 0.2999 |
P3 | −713.33 | 79.99 | 343.25 | 2.0707 | −2.2195 | 0.0287 |
P4 | −717.76 | 7.16 | 327.25 | 1.8732 | 2.0494 | 0.4830 |
P5 | −722.29 | −29.49 | 305.12 | −2.1476 | 1.6316 | 0.4625 |
P6 | −724.48 | −72.92 | 276.26 | −2.2140 | 1.4287 | 0.4932 |
P7 | −723.25 | −106.09 | 254.70 | −2.3654 | 1.1838 | 0.5621 |
Table 4.
Polishing process parameters’ effect on level of surface roughness.
Table 4.
Polishing process parameters’ effect on level of surface roughness.
Set | Abrasive Paper | Contact Force (N) | Applied Pressure (Bar) | Roughness Level |
---|
(1) | P600 | 10 | 3.5 | H, M, H |
(2) | P120 | 10 | 4 | M, M, V.H |
(3) | P240 | 10 | 4.5 | L, V.L, M |
Table 5.
Optimal selected polishing parameters for smooth motion.
Table 5.
Optimal selected polishing parameters for smooth motion.
Abrasive Paper | Contact Force (N) | Pressure (Bar) | Time (s) |
---|
P240 | 10 | 4.0 | (35, 25, 30) |
Table 6.
Surface roughness results (Ra and Rz, mean ± SD, N = 27 per point). Statistical significance tested by paired t–test with Holm–Bonferroni correction.
Table 6.
Surface roughness results (Ra and Rz, mean ± SD, N = 27 per point). Statistical significance tested by paired t–test with Holm–Bonferroni correction.
Point | Metric | Before (Mean ± SD) [µm] | After Baseline (Mean ± SD) [µm] | After ABBIFC (Mean ± SD) [µm] | N | Effect Size (Cohen’s d) | p (adj.) |
---|
MP1 | Ra | 55 ± 30 | 20 ± 15 | 12 ± 7 | 27 | 1.8 | <0.001 |
MP1 | Rz | 110 ± 60 | 40 ± 25 | 25 ± 12 | 27 | 1.9 | <0.001 |
MP2 | Ra | 50 ± 28 | 22 ± 14 | 13 ± 6 | 27 | 1.7 | <0.001 |
MP2 | Rz | 100 ± 55 | 42 ± 22 | 26 ± 11 | 27 | 1.8 | <0.001 |
MP3 | Ra | 48 ± 25 | 21 ± 13 | 14 ± 6 | 27 | 1.6 | <0.001 |
MP3 | Rz | 95 ± 50 | 40 ± 20 | 27 ± 10 | 27 | 1.7 | <0.001 |
MP4 | Ra | 52 ± 27 | 23 ± 13 | 15 ± 7 | 27 | 1.6 | <0.001 |
MP4 | Rz | 104 ± 54 | 44 ± 21 | 28 ± 12 | 27 | 1.7 | <0.001 |
MP5 | Ra | 49 ± 26 | 21 ± 12 | 14 ± 6 | 27 | 1.7 | <0.001 |
MP5 | Rz | 98 ± 51 | 41 ± 20 | 27 ± 11 | 27 | 1.8 | <0.001 |
Table 7.
Material removed (, mm) and corresponding MRR (mm3/s) at each point for Path 1 using the baseline and ABBIFC methods.
Table 7.
Material removed (, mm) and corresponding MRR (mm3/s) at each point for Path 1 using the baseline and ABBIFC methods.
Point | | MRRBaseline | | MRRABBIFC |
---|
P01 | 1.00 | 0.017 | 1.54 | 0.026 |
P11 | 1.35 | 0.022 | 1.56 | 0.026 |
P21 | 0.66 | 0.011 | 0.74 | 0.012 |
P31 | 1.61 | 0.027 | 2.00 | 0.033 |
P41 | 1.09 | 0.018 | 1.51 | 0.025 |
P51 | 2.09 | 0.035 | 2.44 | 0.041 |
P61 | 0.97 | 0.016 | 1.34 | 0.022 |
P71 | 1.85 | 0.031 | 2.20 | 0.037 |
P81 | 1.29 | 0.022 | 1.65 | 0.028 |