Development of a Stress Sensor for In-Situ High-Pressure Deformation Experiments Using Radial X-Ray Diffraction

We developed a stress sensor for in-situ deformation experiments using synchrotron radial X-ray diffraction. This stress sensor provided nearly diffraction-plane-independent stress that, when used in series with a sample, reduced the uncertainty of the average stress estimation acting on a sample. Here, we present the results of a study where pyrope was used as a stress sensor. Using a Deformation-DIA (D-DIA) high-pressure deformation apparatus, pyrope, olivine and alumina were deformed in the same run/cell assembly placed in series along the compression direction. Deformation experiments were conducted at pressures between 4 and 5 GPa and temperatures between 730 and 1273 K with strain-rates between 10⁻⁵ and 10⁻⁶ s⁻¹. Stresses estimated from various (hkl) planes in pyrope were nearly the same; i.e., pyrope is plastically isotropic with ≤10 % variation with (hkl). However, stresses from various (hkl) planes in olivine and alumina varied by approximately a factor of 3. Comparisons between average stresses inferred from pyrope and those from different diffraction planes in olivine and alumina showed that the average stress in these materials evolved from low-end stress, estimated from various (hkl) planes at small strain, to high-end stress at a large strain. This suggests that the rate-controlling slip system in these materials changes from the soft to the hard slip system with strain.