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Journal: Symmetry, 2024
Volume: 16
Number: 418

Article: LW-YOLO: Lightweight Deep Learning Model for Fast and Precise Defect Detection in Printed Circuit Boards
Authors: by Zhaohui Yuan, Xiangyang Tang, Hao Ning and Zhengzhe Yang
Link: https://www.mdpi.com/2073-8994/16/4/418

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