In this work, a stratiform metamaterial is arranged as multiple periods of metal-dielectric symmetrical film stack to provide precise equivalent refractive index and admittance. There are multiple solutions of equivalent refractive index retrieved from the characteristic matrix of the film stack. The correct refractive index is derived by connecting different branches of solution at different ranges of wavelength or thickness of the dielectric layer. The refractive index of an Ag-TiO2
five-layered symmetrical film stack shown in previous work is demonstrated to be positive real instead of negative real. The associated type I iso-frequency curve supports negative refraction. In order to extend the operating wavelength of type I metamaterial, the number of the metal-dielectric symmetrical film stack is increased to reduce the thickness of the dielectric film to approach subwavelength requirement.
This is an open access article distributed under the Creative Commons Attribution License
which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited