Order Article Reprints

Chen X, Zhang L, Zhong Q, Zhang G, Yi Y, Wang D, Zhang Q. Applying Circuit Theory and Risk Assessment Models to Evaluate High-Temperature Risks for Vulnerable Groups and Identify Control Zones. Land. 2025; 14(7):1378. https://doi.org/10.3390/land14071378

Chen, Xuanying, Lang Zhang, Qicheng Zhong, Guilian Zhang, Yang Yi, Di Wang, and Qingping Zhang. 2025. "Applying Circuit Theory and Risk Assessment Models to Evaluate High-Temperature Risks for Vulnerable Groups and Identify Control Zones" Land 14, no. 7: 1378. https://doi.org/10.3390/land14071378

Chen, X., Zhang, L., Zhong, Q., Zhang, G., Yi, Y., Wang, D., & Zhang, Q. (2025). Applying Circuit Theory and Risk Assessment Models to Evaluate High-Temperature Risks for Vulnerable Groups and Identify Control Zones. Land, 14(7), 1378. https://doi.org/10.3390/land14071378