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Open AccessArticle

An Integrated Yield Prediction Model for Greenhouse Tomato

by Dingyi Lin, Ruihua Wei and Lihong Xu *
College of Electronics and Information Engineering, Tongji University, Shanghai 201804, China
*
Author to whom correspondence should be addressed.
These authors contributed equally to this work.
Agronomy 2019, 9(12), 873; https://doi.org/10.3390/agronomy9120873
Received: 8 November 2019 / Revised: 2 December 2019 / Accepted: 5 December 2019 / Published: 11 December 2019
(This article belongs to the Special Issue Greenhouse Technology)
The commonly used greenhouse crop yield prediction models today have their specific application scenarios, which may not ensure the accuracy of the results if the greenhouse environment changes. This greatly restricts their use in the greenhouse environment. To solve this problem, two widely used tomato growth models were compared in the study: TOMGRO and Vanthoor, and then an integrated model was obtained. Through the extended Fourier amplitude sensitivity test (EFAST), the model parameters were divided into three categories: optimized, fixed and ignored. In addition, Bayesian optimization was used as an optimization algorithm, through which the parameters applicable to the greenhouse can be optimized based on the greenhouse data. Compared with TOMGRO and Vanthoor, the output of the integrated model was more reasonable and universal, and the RMSE in the integrated model was 2.5974 while that in TOMGRO and Vanthoor both were over 17, reflecting the fact that the model output was closer to the actual value. According to the verification results of four-year greenhouse data, the model had high performance in predicting yield. View Full-Text
Keywords: greenhouse crop growth model; TOMGRO; Vanthoor; sensitivity analysis; EFAST; Bayesian optimization greenhouse crop growth model; TOMGRO; Vanthoor; sensitivity analysis; EFAST; Bayesian optimization
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Lin, D.; Wei, R.; Xu, L. An Integrated Yield Prediction Model for Greenhouse Tomato. Agronomy 2019, 9, 873.

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