Hu, T.; Zhong, X.; Yang, Q.; Zhou, X.; Li, X.; Yang, S.; Hou, L.; Yao, Q.; Guo, Q.; Kang, Z.
Introgression of Two Quantitative Trait Loci for Stripe Rust Resistance into Three Chinese Wheat Cultivars. Agronomy 2020, 10, 483.
https://doi.org/10.3390/agronomy10040483
AMA Style
Hu T, Zhong X, Yang Q, Zhou X, Li X, Yang S, Hou L, Yao Q, Guo Q, Kang Z.
Introgression of Two Quantitative Trait Loci for Stripe Rust Resistance into Three Chinese Wheat Cultivars. Agronomy. 2020; 10(4):483.
https://doi.org/10.3390/agronomy10040483
Chicago/Turabian Style
Hu, Tian, Xiao Zhong, Qiang Yang, Xinli Zhou, Xin Li, Suizhuang Yang, Lu Hou, Qiang Yao, Qingyun Guo, and Zhensheng Kang.
2020. "Introgression of Two Quantitative Trait Loci for Stripe Rust Resistance into Three Chinese Wheat Cultivars" Agronomy 10, no. 4: 483.
https://doi.org/10.3390/agronomy10040483
APA Style
Hu, T., Zhong, X., Yang, Q., Zhou, X., Li, X., Yang, S., Hou, L., Yao, Q., Guo, Q., & Kang, Z.
(2020). Introgression of Two Quantitative Trait Loci for Stripe Rust Resistance into Three Chinese Wheat Cultivars. Agronomy, 10(4), 483.
https://doi.org/10.3390/agronomy10040483