Chayanun, L.; Hammarberg, S.; Dierks, H.; Otnes, G.; Björling, A.; Borgström, M.T.; Wallentin, J.
Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline. Crystals 2019, 9, 432.
https://doi.org/10.3390/cryst9080432
AMA Style
Chayanun L, Hammarberg S, Dierks H, Otnes G, Björling A, Borgström MT, Wallentin J.
Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline. Crystals. 2019; 9(8):432.
https://doi.org/10.3390/cryst9080432
Chicago/Turabian Style
Chayanun, Lert, Susanna Hammarberg, Hanna Dierks, Gaute Otnes, Alexander Björling, Magnus T Borgström, and Jesper Wallentin.
2019. "Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline" Crystals 9, no. 8: 432.
https://doi.org/10.3390/cryst9080432
APA Style
Chayanun, L., Hammarberg, S., Dierks, H., Otnes, G., Björling, A., Borgström, M. T., & Wallentin, J.
(2019). Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline. Crystals, 9(8), 432.
https://doi.org/10.3390/cryst9080432