Next Article in Journal
Utilization of a CO2 Storage Material: Shape-Controlled Preparation of CaCO3 Microspheres
Next Article in Special Issue
Composition of ω-Phase Particles in Ti(Mo) Alloys Studied by Anomalous X-ray Diffraction
Previous Article in Journal
Electrically Tunable-Focusing Liquid Crystal Microlens Array with Simple Electrode
Previous Article in Special Issue
Coherent Magnetization Rotation of a Layered System Observed by Polarized Neutron Scattering under Grazing Incidence Geometry
Open AccessArticle

Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline

1
Synchrotron radiation research and NanoLund, Lund University, Lund 22100, Sweden
2
Solid state physics and NanoLund, Lund University, Lund 22100, Sweden
3
MAX IV laboratory, Lund University, Lund 22100, Sweden
*
Author to whom correspondence should be addressed.
Crystals 2019, 9(8), 432; https://doi.org/10.3390/cryst9080432
Received: 3 July 2019 / Revised: 9 August 2019 / Accepted: 15 August 2019 / Published: 20 August 2019
(This article belongs to the Special Issue Investigation of Nanostructures with X-ray Scattering Techniques)
The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices. View Full-Text
Keywords: X-ray beam induced current (XBIC); scanning X-ray diffraction (XRD); nanowire X-ray beam induced current (XBIC); scanning X-ray diffraction (XRD); nanowire
Show Figures

Graphical abstract

MDPI and ACS Style

Chayanun, L.; Hammarberg, S.; Dierks, H.; Otnes, G.; Björling, A.; Borgström, M.T.; Wallentin, J. Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline. Crystals 2019, 9, 432.

Show more citation formats Show less citations formats
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Back to TopTop