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Journal: Crystals, 2019
Volume: 9
Number: 432
432
Article: Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline
Authors: by Lert Chayanun, Susanna Hammarberg, Hanna Dierks, Gaute Otnes, Alexander Björling, Magnus T Borgström and Jesper Wallentin
Link: https://www.mdpi.com/2073-4352/9/8/432

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