Rajeev, A.; Chen, W.; Kirch, J.D.; Babcock, S.E.; Kuech, T.F.; Earles, T.; Mawst, L.J.
Interfacial Mixing Analysis for Strained Layer Superlattices by Atom Probe Tomography. Crystals 2018, 8, 437.
https://doi.org/10.3390/cryst8110437
AMA Style
Rajeev A, Chen W, Kirch JD, Babcock SE, Kuech TF, Earles T, Mawst LJ.
Interfacial Mixing Analysis for Strained Layer Superlattices by Atom Probe Tomography. Crystals. 2018; 8(11):437.
https://doi.org/10.3390/cryst8110437
Chicago/Turabian Style
Rajeev, Ayushi, Weixin Chen, Jeremy D. Kirch, Susan E. Babcock, Thomas F. Kuech, Thomas Earles, and Luke J. Mawst.
2018. "Interfacial Mixing Analysis for Strained Layer Superlattices by Atom Probe Tomography" Crystals 8, no. 11: 437.
https://doi.org/10.3390/cryst8110437
APA Style
Rajeev, A., Chen, W., Kirch, J. D., Babcock, S. E., Kuech, T. F., Earles, T., & Mawst, L. J.
(2018). Interfacial Mixing Analysis for Strained Layer Superlattices by Atom Probe Tomography. Crystals, 8(11), 437.
https://doi.org/10.3390/cryst8110437