Article Versions Notes

Bie Y-N, Du C-L, Cai X-L, Ye R, Liu H-J, Zhang Y, Duan X-Y, Zhu J-J. Effect of Source Field Plate Cracks on the Electrical Performance of AlGaN/GaN HEMT Devices. Crystals. 2022; 12(9):1195. https://doi.org/10.3390/cryst12091195

Bie, Ye-Nan, Cheng-Lin Du, Xiao-Long Cai, Ran Ye, Hai-Jun Liu, Yu Zhang, Xiang-Yang Duan, and Jie-Jie Zhu. 2022. "Effect of Source Field Plate Cracks on the Electrical Performance of AlGaN/GaN HEMT Devices" Crystals 12, no. 9: 1195. https://doi.org/10.3390/cryst12091195

Bie, Y.-N., Du, C.-L., Cai, X.-L., Ye, R., Liu, H.-J., Zhang, Y., Duan, X.-Y., & Zhu, J.-J. (2022). Effect of Source Field Plate Cracks on the Electrical Performance of AlGaN/GaN HEMT Devices. Crystals, 12(9), 1195. https://doi.org/10.3390/cryst12091195