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Journal: Crystals, 2021
Volume: 11
Number: 546
546
Article: Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples
Authors: by Sina Mayr, Simone Finizio, Joakim Reuteler, Stefan Stutz, Carsten Dubs, Markus Weigand, Aleš Hrabec, Jörg Raabe and Sebastian Wintz
Link: https://www.mdpi.com/2073-4352/11/5/546

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