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Journal: Crystals, 2021
Volume: 11
Number: 546
Article:
Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples
Authors:
by
Sina Mayr, Simone Finizio, Joakim Reuteler, Stefan Stutz, Carsten Dubs, Markus Weigand, Aleš Hrabec, Jörg Raabe and Sebastian Wintz
Link:
https://www.mdpi.com/2073-4352/11/5/546
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