Im, K.-S.; Siva Pratap Reddy, M.; Choi, Y.J.; Hwang, Y.; An, S.J.; Roh, J.-S.
Investigation of 1/f and Lorentzian Noise in TMAH-treated Normally-Off GaN MISFETs. Crystals 2020, 10, 717.
https://doi.org/10.3390/cryst10080717
AMA Style
Im K-S, Siva Pratap Reddy M, Choi YJ, Hwang Y, An SJ, Roh J-S.
Investigation of 1/f and Lorentzian Noise in TMAH-treated Normally-Off GaN MISFETs. Crystals. 2020; 10(8):717.
https://doi.org/10.3390/cryst10080717
Chicago/Turabian Style
Im, Ki-Sik, Mallem Siva Pratap Reddy, Yeo Jin Choi, Youngmin Hwang, Sung Jin An, and Jea-Seung Roh.
2020. "Investigation of 1/f and Lorentzian Noise in TMAH-treated Normally-Off GaN MISFETs" Crystals 10, no. 8: 717.
https://doi.org/10.3390/cryst10080717
APA Style
Im, K.-S., Siva Pratap Reddy, M., Choi, Y. J., Hwang, Y., An, S. J., & Roh, J.-S.
(2020). Investigation of 1/f and Lorentzian Noise in TMAH-treated Normally-Off GaN MISFETs. Crystals, 10(8), 717.
https://doi.org/10.3390/cryst10080717