Next Article in Journal
Shear Deformation Helps Phase Transition in Pure Iron Thin Films with “Inactive” Surfaces: A Molecular Dynamics Study
Next Article in Special Issue
Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers
Previous Article in Journal
Martensitic Transformation and Crystalline Structure of Ni50Mn50−xSnx Melt-Spun Heusler Alloys
Previous Article in Special Issue
Fixed-Target Serial Synchrotron Crystallography Using Nylon Mesh and Enclosed Film-Based Sample Holder
Open AccessEditorial

Approach of Serial Crystallography

Department of Life Science, Pohang University of Science and Technology, Pohang, Gyeongbuk 37673, Korea
Crystals 2020, 10(10), 854; https://doi.org/10.3390/cryst10100854
Received: 21 September 2020 / Accepted: 22 September 2020 / Published: 23 September 2020
(This article belongs to the Special Issue Approach of Serial Crystallography)
Radiation damage and cryogenic sample environment are an experimental limitation observed in the traditional X-ray crystallography technique. However, the serial crystallography (SX) technique not only helps to determine structures at room temperature with minimal radiation damage, but it is also a useful tool for profound understanding of macromolecules. Moreover, it is a new tool for time-resolved studies. Over the past 10 years, various sample delivery techniques and data collection strategies have been developed in the SX field. It also has a wide range of applications in instruments ranging from the X-ray free electron laser (XFEL) facility to synchrotrons. The importance of the various approaches in terms of the experimental techniques and a brief review of the research carried out in the field of SX has been highlighted in this editorial. View Full-Text
Keywords: serial crystallography (SX); serial femtosecond crystallography (SFX); serial millisecond crystallography (SMX); serial synchrotron crystallography (SSX); sample delivery serial crystallography (SX); serial femtosecond crystallography (SFX); serial millisecond crystallography (SMX); serial synchrotron crystallography (SSX); sample delivery
MDPI and ACS Style

Nam, K.H. Approach of Serial Crystallography. Crystals 2020, 10, 854. https://doi.org/10.3390/cryst10100854

AMA Style

Nam KH. Approach of Serial Crystallography. Crystals. 2020; 10(10):854. https://doi.org/10.3390/cryst10100854

Chicago/Turabian Style

Nam, Ki H. 2020. "Approach of Serial Crystallography" Crystals 10, no. 10: 854. https://doi.org/10.3390/cryst10100854

Find Other Styles
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Search more from Scilit
 
Search
Back to TopTop