Influence of Surface Ligands on Charge-Carrier Trapping and Relaxation in Water-Soluble CdSe@CdS Nanorods
Abstract
:1. Introduction
2. Results
2.1. Particle Synthesis and Ligand Exchange
2.2. Steady-state UV/Vis Absorption Spectroscopy
2.3. Photoluminescence Spectroscopy
Sample | τ1/ns | A1 | τ2/ns | A2 | krad/1011 s−1 |
---|---|---|---|---|---|
TOPO-NR | - | - | 19.7 ± 0.4 | - | 3.9 ± 0.2 |
MUA-NR | - | - | 25.0 ± 0.3 | - | 1.9 ± 0.1 |
HS-PEG-NR | 0.9 ± 0.2 | 0.31 ± 0.14 | 18.0 ± 2.0 | 0.69 ± 0.14 | 2.2 ± 0.4 |
DHLA-NR | 0.8 ± 0.3 | 0.43 ± 0.03 | 8.4 ± 2.5 | 0.57 ± 0.03 | 1.8 ± 0.8 |
DHLA-PEG-NR | 0.6 ± 0.2 | 0.64 ± 0.05 | 7.5 ± 1.1 | 0.36 ± 0.05 | 2.8 ± 0.7 |
PEI-NR | - | - | 20.1 ± 0.4 | - | 4.3 ± 0.2 |
2.4. Transient Absorption Spectroscopy
3. Discussion
4. Materials and Methods
5. Conclusions
Supplementary Materials
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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Sample | Eabs,CdS/eV | Eabs,CdSe/eV | EPL/eV | ΦPL,450 | ΦPL,500 |
---|---|---|---|---|---|
TOPO-NR | 2.70 | 2.22 | 2.16 | 0.58 ± 0.09 | 0.77 ± 0.02 |
MUA-NR | 2.71 | 2.22 | 2.18 | 0.25 ± 0.05 | 0.47 ± 0.02 |
HS-PEG-NR | 2.71 | 2.23 | 2.17 | 0.21 ± 0.07 | 0.39 ± 0.02 |
DHLA-NR | 2.70 | 2.23 | 2.17 | 0.04 ± 0.02 | 0.15 ± 0.02 |
DHLA-PEG-NR | 2.70 | 2.22 | 2.14 | 0.05 ± 0.02 | 0.21 ± 0.02 |
PEI-NR | 2.71 | 2.24 | 2.19 | 0.91 ± 0.12 | 0.87 ± 0.02 |
Ligand | Energy Range | τ1/ps | τ2/ps | τ3/ps | τ4/ps |
---|---|---|---|---|---|
TOPO | 2.48–2.95 eV | 0.2 ± 0.0 | 1.0 ± 0.2 | 34 ± 8 | 530 ± 70 |
1.97–2.34 eV | 0.7 ± 0.0 | 47 ± 12 | 190 ± 50 | 6200 ** | |
MUA | 2.48–2.95 eV | 0.2 ± 0.0 | 2.5 ± 0.4 | 78 ± 6 | 650 ± 40 |
1.97–2.34 eV | 0.5 ± 0.1 | 58 ± 15 | 540 ± 170 | 12200 ** | |
HS-PEG | 2.48–2.95 eV | 0.2 ± 0.1 | 3.0 ± 0.6 | 68 ± 4 | 780 ± 30 |
1.97–2.34 eV | 0.5 ± 0.1 | 42 ± 7 | 450 ± 140 | 4000 ** | |
DHLA | 2.48–2.95 eV | 0.2 ± 0.0 | 4.8 ± 1.0 | 86 ± 7 | 820 ± 40 |
1.97–2.34 eV | 0.5 ± 0.1 | — * | 150 ± 20 | 4000** | |
DHLA-PEG | 2.48–2.95 eV | 0.2 ± 0.0 | 1.7 ± 0.2 | 60 ± 10 | 610 ± 160 |
1.97–2.34 eV | 0.4 ± 0.0 | — * | 190 ± 50 | 2500 ** | |
PEI | 2.48–2.95 eV | 0.2 ± 0.0 | 1.3 ± 0.3 | 25 ± 1 | 470 ± 70 |
1.97–2.34 eV | 1.0 ± 0.2 | 74 ± 11 | 270 ± 30 | 4100 ** |
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Micheel, M.; Liu, B.; Wächtler, M. Influence of Surface Ligands on Charge-Carrier Trapping and Relaxation in Water-Soluble CdSe@CdS Nanorods. Catalysts 2020, 10, 1143. https://doi.org/10.3390/catal10101143
Micheel M, Liu B, Wächtler M. Influence of Surface Ligands on Charge-Carrier Trapping and Relaxation in Water-Soluble CdSe@CdS Nanorods. Catalysts. 2020; 10(10):1143. https://doi.org/10.3390/catal10101143
Chicago/Turabian StyleMicheel, Mathias, Bei Liu, and Maria Wächtler. 2020. "Influence of Surface Ligands on Charge-Carrier Trapping and Relaxation in Water-Soluble CdSe@CdS Nanorods" Catalysts 10, no. 10: 1143. https://doi.org/10.3390/catal10101143