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Journal: Computers, 2017
Volume: 6
Number: 16

Article: Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices
Authors: by Alessandro S. Spinelli, Christian Monzio Compagnoni and Andrea L. Lacaita
Link: https://www.mdpi.com/2073-431X/6/2/16

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