Article Versions Notes

Nicolai EN, Michelson NJ, Settell ML, Hara SA, Trevathan JK, Asp AJ, Stocking KC, Lujan JL, Kozai TDY, Ludwig KA. Design Choices for Next-Generation Neurotechnology Can Impact Motion Artifact in Electrophysiological and Fast-Scan Cyclic Voltammetry Measurements. Micromachines. 2018; 9(10):494. https://doi.org/10.3390/mi9100494

Nicolai, Evan N., Nicholas J. Michelson, Megan L. Settell, Seth A. Hara, James K. Trevathan, Anders J. Asp, Kaylene C. Stocking, J. Luis Lujan, Takashi D.Y. Kozai, and Kip A. Ludwig. 2018. "Design Choices for Next-Generation Neurotechnology Can Impact Motion Artifact in Electrophysiological and Fast-Scan Cyclic Voltammetry Measurements" Micromachines 9, no. 10: 494. https://doi.org/10.3390/mi9100494

Nicolai, E. N., Michelson, N. J., Settell, M. L., Hara, S. A., Trevathan, J. K., Asp, A. J., Stocking, K. C., Lujan, J. L., Kozai, T. D. Y., & Ludwig, K. A. (2018). Design Choices for Next-Generation Neurotechnology Can Impact Motion Artifact in Electrophysiological and Fast-Scan Cyclic Voltammetry Measurements. Micromachines, 9(10), 494. https://doi.org/10.3390/mi9100494