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Journal: Micromachines, 2014
Volume: 5
Number: 570

Article: Reliability Investigation of GaN HEMTs for MMICs Applications
Authors: by Alessandro Chini, Gaudenzio Meneghesso, Alessio Pantellini, Claudio Lanzieri and Enrico Zanoni
Link: https://www.mdpi.com/2072-666X/5/3/570

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