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Micromachines2014, 5(3), 570-582;https://doi.org/10.3390/mi5030570

Journal: MicromachinesVolume: 5Number: 570

Article: Reliability Investigation of GaN HEMTs for MMICs Applications

Authors:
Alessandro Chini^1,*,
Gaudenzio Meneghesso² and
Alessio Pantellini³
et al.

Link: https://www.mdpi.com/2072-666X/5/3/570

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