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Journal: Micromachines, 2014
Volume: 5
Number: 570
Article:
Reliability Investigation of GaN HEMTs for MMICs Applications
Authors:
by
Alessandro Chini, Gaudenzio Meneghesso, Alessio Pantellini, Claudio Lanzieri and Enrico Zanoni
Link:
https://www.mdpi.com/2072-666X/5/3/570
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