Chen, Y.; Huang, J.; Zeng, Y.; Jiang, Y.; Wang, S.; Chen, S.; Liu, H.
A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices. Micromachines 2026, 17, 452.
https://doi.org/10.3390/mi17040452
AMA Style
Chen Y, Huang J, Zeng Y, Jiang Y, Wang S, Chen S, Liu H.
A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices. Micromachines. 2026; 17(4):452.
https://doi.org/10.3390/mi17040452
Chicago/Turabian Style
Chen, Yilei, Jin Huang, Yuxiang Zeng, Yi Jiang, Shulong Wang, Shupeng Chen, and Hongxia Liu.
2026. "A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices" Micromachines 17, no. 4: 452.
https://doi.org/10.3390/mi17040452
APA Style
Chen, Y., Huang, J., Zeng, Y., Jiang, Y., Wang, S., Chen, S., & Liu, H.
(2026). A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices. Micromachines, 17(4), 452.
https://doi.org/10.3390/mi17040452
