Schoenen, J.; Gehrunger, J.; Mayrhofer, L.; Oster, T.; Piros, E.; Kim, T.; Arzumanov, A.; Miranda, E.; Hofmann, K.; Alff, L.;
et al. Impact of Fabrication Defects on FPGA Logic Using Memristor-Based Memory Cells. Micromachines 2026, 17, 429.
https://doi.org/10.3390/mi17040429
AMA Style
Schoenen J, Gehrunger J, Mayrhofer L, Oster T, Piros E, Kim T, Arzumanov A, Miranda E, Hofmann K, Alff L,
et al. Impact of Fabrication Defects on FPGA Logic Using Memristor-Based Memory Cells. Micromachines. 2026; 17(4):429.
https://doi.org/10.3390/mi17040429
Chicago/Turabian Style
Schoenen, Jonas, Jonas Gehrunger, Leon Mayrhofer, Timo Oster, Eszter Piros, Taewook Kim, Alexey Arzumanov, Enrique Miranda, Klaus Hofmann, Lambert Alff,
and et al. 2026. "Impact of Fabrication Defects on FPGA Logic Using Memristor-Based Memory Cells" Micromachines 17, no. 4: 429.
https://doi.org/10.3390/mi17040429
APA Style
Schoenen, J., Gehrunger, J., Mayrhofer, L., Oster, T., Piros, E., Kim, T., Arzumanov, A., Miranda, E., Hofmann, K., Alff, L., & Hochberger, C.
(2026). Impact of Fabrication Defects on FPGA Logic Using Memristor-Based Memory Cells. Micromachines, 17(4), 429.
https://doi.org/10.3390/mi17040429
