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Journal: Micromachines, 2025
Volume: 16
Number: 873

Article: On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTs
Authors: by Giovanni Giorgino, Cristina Miccoli, Marcello Cioni, Santo Reina, Tariq Wakrim, Virgil Guillon, Nossikpendou Yves Sama, Pauline Gaillard, Mohammed Zeghouane, Hyon-Ju Chauveau, Maria Eloisa Castagna, Aurore Constant, Ferdinando Iucolano and Alessandro Chini
Link: https://www.mdpi.com/2072-666X/16/8/873

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