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Journal: MicromachinesVolume: 16Number: 844
Article: Wafer Defect Image Generation Method Based on Improved Styleganv3 Network
  • Authors:
  • Jialin Zou1,
  • Hongcheng Wang1,* and
  • Jiajin Zhong2
Link: https://www.mdpi.com/2072-666X/16/8/844

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