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Journal: Micromachines, 2025
Volume: 16
Number: 1369
1369
Article: The Impact of Load-Dump Stress on p-GaN HEMTs Under Floating Gate Condition
Authors: by Zhipeng Shen, Yijun Shi, Lijuan Wu, Liang He, Xinghuan Chen, Yuan Chen, Dongsheng Zhao, Jiahong He, Gengbin Zhu, Huangtao Zeng and Guoguang Lu
Link: https://www.mdpi.com/2072-666X/16/12/1369

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