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Journal: Micromachines, 2025
Volume: 16
Number: 1304

Article: Post-Bonding Crack-Induced Di-Cantilever Bending (PBC-DCB): A Novel Method for Quantitative Evaluation of Bonding Strength for Wafer-to-Wafer and Die-to-Wafer Hybrid Bonding
Authors: by Tianze Zheng, Yuan Xu, Cong Mei, Yingjie Chen, Liu Chang, Gangli Yang, Qiuhan Hu, Tailong Shi, Yuan Yuan, Zongguang Yu and Liyi Li
Link: https://www.mdpi.com/2072-666X/16/12/1304

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