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Journal: Micromachines, 2025
Volume: 16
Number: 1278
Article:
An Overview on Formation of Radiation-Induced Interface Traps in Silicon-Based Devices
Authors:
by
Xuehui Dai, Min Zhu, Fei Wu, Yanru Ren and Minghui Liu
Link:
https://www.mdpi.com/2072-666X/16/11/1278
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