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Journal: Micromachines, 2025
Volume: 16
Number: 1278

Article: An Overview on Formation of Radiation-Induced Interface Traps in Silicon-Based Devices
Authors: by Xuehui Dai, Min Zhu, Fei Wu, Yanru Ren and Minghui Liu
Link: https://www.mdpi.com/2072-666X/16/11/1278

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