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Journal: Micromachines, 2025
Volume: 16
Number: 1246

Article: SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation
Authors: by Alex Metreveli, Anders Hallén and Carl-Mikael Zetterling
Link: https://www.mdpi.com/2072-666X/16/11/1246

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