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Journal: Micromachines, 2025
Volume: 16
Number: 1246
Article:
SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation
Authors:
by
Alex Metreveli, Anders Hallén and Carl-Mikael Zetterling
Link:
https://www.mdpi.com/2072-666X/16/11/1246
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