Article Versions Notes

Luo Q, Lin D, Lu J, Ke C, Tian Z, Jiang F, Zhu J, Huang H. Atomic-Scale Revelation of Voltage-Modulated Electrochemical Corrosion Mechanism in 4H-SiC Substrate. Micromachines. 2025; 16(10):1129. https://doi.org/10.3390/mi16101129

Luo, Qiufa, Dianlong Lin, Jing Lu, Congming Ke, Zige Tian, Feng Jiang, Jianhui Zhu, and Hui Huang. 2025. "Atomic-Scale Revelation of Voltage-Modulated Electrochemical Corrosion Mechanism in 4H-SiC Substrate" Micromachines 16, no. 10: 1129. https://doi.org/10.3390/mi16101129

Luo, Q., Lin, D., Lu, J., Ke, C., Tian, Z., Jiang, F., Zhu, J., & Huang, H. (2025). Atomic-Scale Revelation of Voltage-Modulated Electrochemical Corrosion Mechanism in 4H-SiC Substrate. Micromachines, 16(10), 1129. https://doi.org/10.3390/mi16101129