Diaz-Fortuny, J.; Saraza-Canflanca, P.; Bury, E.; Degraeve, R.; Kaczer, B.
An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage. Micromachines 2024, 15, 769.
https://doi.org/10.3390/mi15060769
AMA Style
Diaz-Fortuny J, Saraza-Canflanca P, Bury E, Degraeve R, Kaczer B.
An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage. Micromachines. 2024; 15(6):769.
https://doi.org/10.3390/mi15060769
Chicago/Turabian Style
Diaz-Fortuny, Javier, Pablo Saraza-Canflanca, Erik Bury, Robin Degraeve, and Ben Kaczer.
2024. "An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage" Micromachines 15, no. 6: 769.
https://doi.org/10.3390/mi15060769
APA Style
Diaz-Fortuny, J., Saraza-Canflanca, P., Bury, E., Degraeve, R., & Kaczer, B.
(2024). An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage. Micromachines, 15(6), 769.
https://doi.org/10.3390/mi15060769