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Journal: Micromachines, 2024
Volume: 15
Number: 658
Article:
A Study on the Frequency-Domain Black-Box Modeling Method for the Nonlinear Behavioral Level Conduction Immunity of Integrated Circuits Based on X-Parameter Theory
Authors:
by
Xi Chen, Shuguo Xie, Mengyuan Wei and Yan Yang
Link:
https://www.mdpi.com/2072-666X/15/5/658
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