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Journal: Micromachines, 2024
Volume: 15
Number: 1448
1448
Article: A Study of Reverse Characteristics of GaN-on-Si Quasi-Vertical PiN Diode with Beveled Sidewall and Fluorine Plasma Treatment
Authors: by Fuchun Jia, Qingyuan Chang, Mengdi Li, Yungang Liu, Ziyan Lu, Jifan Zhang, Jinming Lai, Hao Lu, Yang Lu, Bin Hou, Ling Yang and Xiaohua Ma
Link: https://www.mdpi.com/2072-666X/15/12/1448

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