Huang, P.; Li, B.; Wei, M.; Hao, X.; Chen, X.; Huang, X.; Huang, W.; Zhou, S.; Wen, X.; Xie, S.;
et al. Electromagnetic Susceptibility Analysis of the Operational Amplifier to Conducted EMI Injected through the Power Supply Port. Micromachines 2024, 15, 121.
https://doi.org/10.3390/mi15010121
AMA Style
Huang P, Li B, Wei M, Hao X, Chen X, Huang X, Huang W, Zhou S, Wen X, Xie S,
et al. Electromagnetic Susceptibility Analysis of the Operational Amplifier to Conducted EMI Injected through the Power Supply Port. Micromachines. 2024; 15(1):121.
https://doi.org/10.3390/mi15010121
Chicago/Turabian Style
Huang, Peng, Bing Li, Mengyuan Wei, Xuchun Hao, Xi Chen, Xiaozong Huang, Wei Huang, Shuling Zhou, Xiaokang Wen, Shuguo Xie,
and et al. 2024. "Electromagnetic Susceptibility Analysis of the Operational Amplifier to Conducted EMI Injected through the Power Supply Port" Micromachines 15, no. 1: 121.
https://doi.org/10.3390/mi15010121
APA Style
Huang, P., Li, B., Wei, M., Hao, X., Chen, X., Huang, X., Huang, W., Zhou, S., Wen, X., Xie, S., & Su, D.
(2024). Electromagnetic Susceptibility Analysis of the Operational Amplifier to Conducted EMI Injected through the Power Supply Port. Micromachines, 15(1), 121.
https://doi.org/10.3390/mi15010121