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Journal: Micromachines, 2023
Volume: 14
Number: 602
Article:
Investigation of Anomalous Degradation Tendency of Low-Frequency Noise in Irradiated SOI-NMOSFETs
Authors:
by
Rui Liu, Linchun Gao, Juanjuan Wang, Tao Ni, Yifan Li, Runjian Wang, Duoli Li, Jianhui Bu, Chuanbin Zeng, Bo Li and Jiajun Luo
Link:
https://www.mdpi.com/2072-666X/14/3/602
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