Zou, X.; Yang, J.; Qiao, Q.; Zou, X.; Chen, J.; Shi, Y.; Ren, K.
Trap Characterization Techniques for GaN-Based HEMTs: A Critical Review. Micromachines 2023, 14, 2044.
https://doi.org/10.3390/mi14112044
AMA Style
Zou X, Yang J, Qiao Q, Zou X, Chen J, Shi Y, Ren K.
Trap Characterization Techniques for GaN-Based HEMTs: A Critical Review. Micromachines. 2023; 14(11):2044.
https://doi.org/10.3390/mi14112044
Chicago/Turabian Style
Zou, Xiazhi, Jiayi Yang, Qifeng Qiao, Xinbo Zou, Jiaxiang Chen, Yang Shi, and Kailin Ren.
2023. "Trap Characterization Techniques for GaN-Based HEMTs: A Critical Review" Micromachines 14, no. 11: 2044.
https://doi.org/10.3390/mi14112044
APA Style
Zou, X., Yang, J., Qiao, Q., Zou, X., Chen, J., Shi, Y., & Ren, K.
(2023). Trap Characterization Techniques for GaN-Based HEMTs: A Critical Review. Micromachines, 14(11), 2044.
https://doi.org/10.3390/mi14112044