Schels, A.; Herdl, F.; Hausladen, M.; Wohlfartsstätter, D.; Edler, S.; Bachmann, M.; Pahlke, A.; Schreiner, R.; Hansch, W.
Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays. Micromachines 2023, 14, 2008.
https://doi.org/10.3390/mi14112008
AMA Style
Schels A, Herdl F, Hausladen M, Wohlfartsstätter D, Edler S, Bachmann M, Pahlke A, Schreiner R, Hansch W.
Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays. Micromachines. 2023; 14(11):2008.
https://doi.org/10.3390/mi14112008
Chicago/Turabian Style
Schels, Andreas, Florian Herdl, Matthias Hausladen, Dominik Wohlfartsstätter, Simon Edler, Michael Bachmann, Andreas Pahlke, Rupert Schreiner, and Walter Hansch.
2023. "Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays" Micromachines 14, no. 11: 2008.
https://doi.org/10.3390/mi14112008
APA Style
Schels, A., Herdl, F., Hausladen, M., Wohlfartsstätter, D., Edler, S., Bachmann, M., Pahlke, A., Schreiner, R., & Hansch, W.
(2023). Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays. Micromachines, 14(11), 2008.
https://doi.org/10.3390/mi14112008
