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Journal: Micromachines, 2022
Volume: 13
Number: 1075
Article:
Bond Wire Damage Detection Method on Discrete MOSFETs Based on Two-Port Network Measurement
Authors:
by
Minghui Yun, Miao Cai, Daoguo Yang, Yiren Yang, Jing Xiao and Guoqi Zhang
Link:
https://www.mdpi.com/2072-666X/13/7/1075
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