Yun, M.; Cai, M.; Yang, D.; Yang, Y.; Xiao, J.; Zhang, G.
Bond Wire Damage Detection Method on Discrete MOSFETs Based on Two-Port Network Measurement. Micromachines 2022, 13, 1075.
https://doi.org/10.3390/mi13071075
AMA Style
Yun M, Cai M, Yang D, Yang Y, Xiao J, Zhang G.
Bond Wire Damage Detection Method on Discrete MOSFETs Based on Two-Port Network Measurement. Micromachines. 2022; 13(7):1075.
https://doi.org/10.3390/mi13071075
Chicago/Turabian Style
Yun, Minghui, Miao Cai, Daoguo Yang, Yiren Yang, Jing Xiao, and Guoqi Zhang.
2022. "Bond Wire Damage Detection Method on Discrete MOSFETs Based on Two-Port Network Measurement" Micromachines 13, no. 7: 1075.
https://doi.org/10.3390/mi13071075
APA Style
Yun, M., Cai, M., Yang, D., Yang, Y., Xiao, J., & Zhang, G.
(2022). Bond Wire Damage Detection Method on Discrete MOSFETs Based on Two-Port Network Measurement. Micromachines, 13(7), 1075.
https://doi.org/10.3390/mi13071075