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Journal: Micromachines, 2022
Volume: 13
Number: 748
748
Article: Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode
Authors: by Haitao Zhang, Xuanwu Kang, Yingkui Zheng, Ke Wei, Hao Wu, Xinyu Liu, Tianchun Ye and Zhi Jin
Link: https://www.mdpi.com/2072-666X/13/5/748

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