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Journal: Micromachines, 2021
Volume: 12
Number: 549

Article: An Experimental and Systematic Insight into the Temperature Sensitivity for a 0.15-µm Gate-Length HEMT Based on the GaN Technology
Authors: by Mohammad Abdul Alim, Christophe Gaquiere and Giovanni Crupi
Link: https://www.mdpi.com/2072-666X/12/5/549

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