Lee, H.; Kim, J.; Shin, K.; Moon, W.
Improving the Performance of the ToGoFET Probe: Advances in Design, Fabrication, and Signal Processing. Micromachines 2021, 12, 1303.
https://doi.org/10.3390/mi12111303
AMA Style
Lee H, Kim J, Shin K, Moon W.
Improving the Performance of the ToGoFET Probe: Advances in Design, Fabrication, and Signal Processing. Micromachines. 2021; 12(11):1303.
https://doi.org/10.3390/mi12111303
Chicago/Turabian Style
Lee, Hoontaek, Junsoo Kim, Kumjae Shin, and Wonkyu Moon.
2021. "Improving the Performance of the ToGoFET Probe: Advances in Design, Fabrication, and Signal Processing" Micromachines 12, no. 11: 1303.
https://doi.org/10.3390/mi12111303
APA Style
Lee, H., Kim, J., Shin, K., & Moon, W.
(2021). Improving the Performance of the ToGoFET Probe: Advances in Design, Fabrication, and Signal Processing. Micromachines, 12(11), 1303.
https://doi.org/10.3390/mi12111303