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Journal: Micromachines, 2020
Volume: 11
Number: 254

Article: Advances in High-Resolution Radiation Detection Using 4H-SiC Epitaxial Layer Devices
Authors: by Krishna C. Mandal, Joshua W. Kleppinger and Sandeep K. Chaudhuri
Link: https://www.mdpi.com/2072-666X/11/3/254

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