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Journal: Micromachines, 2019
Volume: 10
Number: 356

Article: Investigation of Intra-Nitride Charge Migration Suppression in SONOS Flash Memory
Authors: by Seung-Dong Yang, Jun-Kyo Jung, Jae-Gab Lim, Seong-gye Park, Hi-Deok Lee and Ga-Won Lee
Link: https://www.mdpi.com/2072-666X/10/6/356

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