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Journal: Remote Sens., 2015
Volume: 7
Number: 12737

Article: The Potential of Pan-Sharpened EnMAP Data for the Assessment of Wheat LAI
Authors: by Bastian Siegmann, Thomas Jarmer, Florian Beyer and Manfred Ehlers
Link: https://www.mdpi.com/2072-4292/7/10/12737

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