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Journal: Remote Sens., 2015
Volume: 7
Number: 12737
Article:
The Potential of Pan-Sharpened EnMAP Data for the Assessment of Wheat LAI
Authors:
by
Bastian Siegmann, Thomas Jarmer, Florian Beyer and Manfred Ehlers
Link:
https://www.mdpi.com/2072-4292/7/10/12737
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