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Journal: Remote Sens., 2025
Volume: 17
Number: 1717
Article:
Advancing Corn Yield Mapping in Kenya Through Transfer Learning
Authors:
by
Ahaan Bohra, Sophie Nottmeyer, Chenchen Ren, Shuo Chen and Yuchi Ma
Link:
https://www.mdpi.com/2072-4292/17/10/1717
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