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Journal: Remote Sens., 2024
Volume: 16
Number: 3217
Article:
Improved Winter Wheat Yield Estimation by Combining Remote Sensing Data, Machine Learning, and Phenological Metrics
Authors:
by
Shiji Li, Jianxi Huang, Guilong Xiao, Hai Huang, Zhigang Sun and Xuecao Li
Link:
https://www.mdpi.com/2072-4292/16/17/3217
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