Zheng, J.; Du, Y.; Chen, D.; Ying, W.; Zhao, H.; Liu, K.; Qiu, J.
Resonant Gate Drive Circuit with Active Clamping to Increase Efficiency and Reliability. World Electr. Veh. J. 2024, 15, 74.
https://doi.org/10.3390/wevj15020074
AMA Style
Zheng J, Du Y, Chen D, Ying W, Zhao H, Liu K, Qiu J.
Resonant Gate Drive Circuit with Active Clamping to Increase Efficiency and Reliability. World Electric Vehicle Journal. 2024; 15(2):74.
https://doi.org/10.3390/wevj15020074
Chicago/Turabian Style
Zheng, Jiaming, Yi Du, Dachuan Chen, Wucheng Ying, Hui Zhao, Kefu Liu, and Jian Qiu.
2024. "Resonant Gate Drive Circuit with Active Clamping to Increase Efficiency and Reliability" World Electric Vehicle Journal 15, no. 2: 74.
https://doi.org/10.3390/wevj15020074
APA Style
Zheng, J., Du, Y., Chen, D., Ying, W., Zhao, H., Liu, K., & Qiu, J.
(2024). Resonant Gate Drive Circuit with Active Clamping to Increase Efficiency and Reliability. World Electric Vehicle Journal, 15(2), 74.
https://doi.org/10.3390/wevj15020074