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Journal: Algorithms, 2025
Volume: 18
Number: 370

Article: DScanNet: Packaging Defect Detection Algorithm Based on Selective State Space Models
Authors: by Yirong Luo, Yanping Du, Zhaohua Wang, Jingtian Mo, Wenxuan Yu and Shuihai Dou
Link: https://www.mdpi.com/1999-4893/18/6/370

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