Luo, Y.; Du, Y.; Wang, Z.; Mo, J.; Yu, W.; Dou, S.
DScanNet: Packaging Defect Detection Algorithm Based on Selective State Space Models. Algorithms 2025, 18, 370.
https://doi.org/10.3390/a18060370
AMA Style
Luo Y, Du Y, Wang Z, Mo J, Yu W, Dou S.
DScanNet: Packaging Defect Detection Algorithm Based on Selective State Space Models. Algorithms. 2025; 18(6):370.
https://doi.org/10.3390/a18060370
Chicago/Turabian Style
Luo, Yirong, Yanping Du, Zhaohua Wang, Jingtian Mo, Wenxuan Yu, and Shuihai Dou.
2025. "DScanNet: Packaging Defect Detection Algorithm Based on Selective State Space Models" Algorithms 18, no. 6: 370.
https://doi.org/10.3390/a18060370
APA Style
Luo, Y., Du, Y., Wang, Z., Mo, J., Yu, W., & Dou, S.
(2025). DScanNet: Packaging Defect Detection Algorithm Based on Selective State Space Models. Algorithms, 18(6), 370.
https://doi.org/10.3390/a18060370